Cambridge University Press · Wiley
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Electron Microscopy and Strength of Crystals; Proceedings of the First Berkeley International Materials Conference: the Impact of Transmission | 978-0-470-85950-6 (0-470-85950-4) | 1963 | Gareth Thomas |
| Impurity Diffusion and Gettering in Silicon: Volume 36 | 978-0-931837-01-2 (0-931837-01-4) | 1985 | Richard B. Fair · Charles W. Pearce |