Cambridge University Press · Society of Photo Optical
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Nondestructive Methods for Materials Characterization: Volume 591 | 978-1-107-41333-7 (1-107-41333-8) | 2014 | |
| Testing, Reliability, And Application Of Micro-And Nano-Material Systems III | 978-0-8194-5747-9 (0-8194-5747-7) | 2005 | Robert E. Geer · Norbert Meyendor · Bernd Michel |