American Institute of Physics · Thomas More Pr
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 978-0-7354-0712-1 (0-7354-0712-6) | 2009 | David G. Seiler · Alain C. Diebold · Robert McDonald · C. Michael Garner · Rajinder P. Khosla · Erik M. Secula |
| Start Digging | 978-0-88347-204-0 (0-88347-204-X) | 1987 | |
D,. H.. · Dain Heer · Dan Hoeyer · Diana Hauer · Donna Haraway