| title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Advanced Scanning Electron Microscopy and X-Ray Microanalysis | Paperback | 978-1-4757-9028-3 (1-4757-9028-7) | 2013 | Patrick Echlin · Joseph Goldstein |
| Advanced Scanning Electron Microscopy and X-Ray Microanalysis | Hardcover | 978-0-306-42140-2 (0-306-42140-2) | 1986 | Patrick Echlin · Joseph Goldstein · David C. Joy · Dale E. Newbury |