Advanced Scanning Electron Microscopy and X-Ray Microanalysis
by:
Patrick Echlin
·
C.E. Fiori
·
Joseph Goldstein
Paperback
details (
USA
).
ISBN: 978-1-4757-9028-3
ISBN-10: 1-4757-9028-7
Springer
· 2013
See also:
1986
Hardcover
Advanced Scanning Electron Microscopy and X-Ray Microanalysis