Amal Chabli

A.C.

titleISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Frontiers of Characterization and Metrology for Nanoelectronics: 2011978-O-7354-O973-6
(O-7354-O973-O)
2012David G. Seiler · Alain C. Diebold · Robert McDonald · Erik M. Secula

Amal Chattopadhyay

sweeping with target
You inflated the papers
beside the luggage