Electromigration in Thin Films and Electronic Devices: Materials and Reliability (Woodhead Publishing Series in Electronic and Optical Materials)

by Choong-Un Kim Hardcover details (United Kingdom). (see also: eBook (Kindle)) details (USA). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) details (Spain - España). (see also: Versión Kindle) ISBN: 978-1-84569-937-6 ISBN-10: 1-84569-937-8 Woodhead Publishing Ltd · 2011