Electromigration in Thin Films and Electronic Devices: Materials and Reliability (Woodhead Publishing Series in Electronic and Optical Materials)

by Choong-Un Kim Paperback details (UK). (see also: eBook (Kindle)) details (USA). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) details (Canada). (see also: eBook (Kindle)) ISBN: 978-0-08-101696-1 ISBN-10: 0-08-101696-4 Woodhead Publishing · 2016