High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

Application

by Jon Orloff

Paperback

ISBN: 978-1-4613-5229-7

ISBN-10: 1-4613-5229-0

Springer · 2012

See also:
2002HardcoverHigh Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology