High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

Application

by: Jon Orloff · Lynwood Swanson · Mark Utlaut

Hardcover

ISBN: 978-0-306-47350-0

ISBN-10: 0-306-47350-X

Springer · 2002
See also:
2012PaperbackHigh Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology