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by: Alfred Stein · Wenzhong Shi · Wietske BijkerHardcover details (United States). details (UK). details (Germany). details (Canada). ISBN: 978-1-4200-6926-6 ISBN-10: 1-4200-6926-8 CRC Press · 2008 |
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2019 | Paperback | Quality Aspects in Spatial Data Mining |