Materials, Technology and Reliability for Advanced Interconnects 2005: Volume 863 (MRS Proceedings)

Reliability

by: Paul R. Besser · Andrew J. McKerrow · Francsca Iacopi · C. P. Wong · Joost J. Vlassak

Paperback

ISBN: 978-1-107-40898-2

ISBN-10: 1-107-40898-9

Cambridge University Press · 2014