Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II:)

Technology

by: Gianfranco Pacchioni · Linards Skuja · David L. Griscom

Paperback

ISBN: 978-0-7923-6686-7

ISBN-10: 0-7923-6686-7

Springer · 2000

See also:
2000HardcoverDefects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II:)