Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II:)
by:
Gianfranco Pacchioni
·
Linards Skuja
·
David L. Griscom
Hardcover
details (
USA
).
ISBN: 978-0-7923-6685-0
ISBN-10: 0-7923-6685-9
Springer
· 2000
See also:
2000
Paperback
Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II:)