Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-state Sciences)
by:
Michel Lannoo
·
J. Bourgoin
Hardcover
details (
USA
).
ISBN: 978-0-387-11515-3
ISBN-10: 0-387-11515-3
Springer Verlag
· 1983
See also:
1983
Gebundene Ausgabe
Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences)