Point Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-state Sciences)

Experimental

by: Michel Lannoo · J. Bourgoin

Hardcover

ISBN: 978-0-387-11515-3

ISBN-10: 0-387-11515-3

Springer Verlag · 1983

See also:
1983Gebundene AusgabePoint Defects in Semiconductors II: Experimental Aspects (Springer Series in Solid-State Sciences)