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by: Yang W. Lee · Leo L. Pipino · Richard Y. Wang · James D. FunkPaperback details (USA). details (UK). details (Germany). details (Canada). ISBN: 978-0-262-51335-7 ISBN-10: 0-262-51335-8 The MIT Press · 2009 |
See also: | ||
2009 | Printed Access Code | Journey to Data Quality |
2006 | Hardcover | Journey to Data Quality |