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by: Yang W. Lee · Leo L. Pipino · James D. Funk · Richard Y. WangHardcover details (United States). details (UK). details (Germany). details (Canada). ISBN: 978-0-262-12287-0 ISBN-10: 0-262-12287-1 The MIT Press · 2006 |
| See also: | ||
| 2009 | Printed Access Code | Journey to Data Quality |