title | media type | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
---|---|---|---|---|
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections | Paperback | 978-1-4471-2641-6 (1-4471-2641-6) | 2013 | Cher Ming Tan · Wei Li |
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections | Hardcover | 978-0-85729-309-1 (0-85729-309-5) | 2011 | Cher Ming Tan · Wei Li |
Semiconductor Process Reliability in Practice | " | 978-0-07-175427-9 (0-07-175427-X) | 2012 | Waisum Wong · Juin Liou |
Zhaoyong Guan · Zheng Guayan · Zheng guohan · Zhong Guan · Zhongxue Gan · Zong Geem