Zhenghao Gan

McGraw-Hill · Springer

titlemedia typeISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Applications of Finite Element Methods for Reliability Studies on ULSI InterconnectionsPaperback978-1-4471-2641-6
(1-4471-2641-6)
2013Cher Ming Tan · Wei Li
Applications of Finite Element Methods for Reliability Studies on ULSI InterconnectionsHardcover978-0-85729-309-1
(0-85729-309-5)
2011Cher Ming Tan · Wei Li
Semiconductor Process Reliability in Practice   "978-0-07-175427-9
(0-07-175427-X)
2012Waisum Wong · Juin Liou

Zhaoyong Guan · Zheng Guayan · Zheng guohan · Zhong Guan · Zhongxue Gan · Zong Geem

 

Zhenhai Guo