| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Semiconductor Process Reliability in Practice | 978-0-07-175427-9 (0-07-175427-X) | 2012 | Zhenghao Gan · Juin Liou |
| Test Structure, Modeling and Characterization of CMOS-Based RF Devices | 978-0-471-46965-0 (0-471-46965-3) | 2012 | Juin J. Liou · Rao J. Rapeta |