| Titel | Art | ISBN-13 (ISBN-10) | Erscheinungsjahr |
|---|---|---|---|
| Electrical Atomic Force Microscopy for Nanoelectronics | Gebunden | 978-3-030-15611-4 (3-030-15611-7) | 2019 |
| Metrology and Physical Mechanisms in New Generation Ionic Devices | Taschenbuch | 978-3-319-81906-8 (3-319-81906-2) | 2018 |
| Metrology and Physical Mechanisms in New Generation Ionic Devices | Gebunden | 978-3-319-39530-2 (3-319-39530-0) | 2016 |