| title | media type | ISBN-13 | year of publica- tion | other author(s) | |
|---|---|---|---|---|---|
| Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications, Volume 37 | Hardcover | 978-0-12-475984-8 | 2000 | Yiping Zhao · Gwo-Ching Wang | |
| Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms | Taschenbuch | 978-3-319-43218-2 | 2016 | Juan Pablo Borja · Joel Plawsky | |
| Evolution of Thin Film Morphology: Modeling and Simulations | Hardcover | 978-0-387-75108-5 | 2007 | Matthew Pelliccione | |
| Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability | " | 978-1-4614-1811-5 | 2011 | Ming He | |
| Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability | Paperback | 978-1-4614-1813-9 | 2011 | " | |
| RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis | " | 978-1-4939-5366-0 | 2016 | Gwo-Ching Wang | |
| RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis | Hardcover | 978-1-4614-9286-3 | 2013 | " |