Titel | Art | ISBN-13 | Erschei- nungsjahr | andere Autoren | |
---|---|---|---|---|---|
Bias Temperature Instability for Devices and Circuits | Paperback | 978-1-4939-5529-9 | 2016 | ||
Bias Temperature Instability for Devices and Circuits | Hardcover | 978-1-4614-7908-6 | 2013 | ||
Hot Carrier Degradation in Semiconductor Devices | Gebunden | 978-3-319-08993-5 | 2014 | ||
Noise in Nanoscale Semiconductor Devices | " | 978-3-030-37499-0 | 2020 | ||
Organic Electronics | " | 978-3-642-04537-0 | 2009 | Gregor Meller | |
Simulation of Semiconductor Processes and Devices 2007: SISPAD 2007 | Taschenbuch | 978-3-7091-1911-2 | 2017 | Siegfried Selberherr | |
Simulation of Semiconductor Processes and Devices 2007: SISPAD 2007 | " | 978-3-211-72860-4 | 2007 | " |