Tibor Grasser

TitelArt ISBN-13Erschei-
nungsjahr
andere Autoren
Bias Temperature Instability for Devices and CircuitsPaperback
978-1-4939-5529-92016
Bias Temperature Instability for Devices and CircuitsHardcover
978-1-4614-7908-62013
Hot Carrier Degradation in Semiconductor DevicesGebunden 978-3-319-08993-52014
Noise in Nanoscale Semiconductor Devices  " 978-3-030-37499-02020
Organic Electronics  " 978-3-642-04537-02009Gregor Meller
Simulation of Semiconductor Processes and Devices 2007: SISPAD 2007Taschenbuch 978-3-7091-1911-22017Siegfried Selberherr
Simulation of Semiconductor Processes and Devices 2007: SISPAD 2007  " 978-3-211-72860-42007  "

Tibor Gyalog