| Titel | Art | ISBN-13 (ISBN-10) | Erschei- nungsjahr | andere Autoren |
|---|---|---|---|---|
| Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization | Taschenbuch | 978-3-030-09298-6 (3-030-09298-4) | 2019 | Sascha Sadewasser |
| Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization | Gebunden | 978-3-319-75686-8 (3-319-75686-9) | 2018 | " |
| Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces | " | 978-3-642-22565-9 (3-642-22565-9) | 2011 | " |