| Titel | ISBN-13 (ISBN-10) | Erscheinungsjahr |
|---|---|---|
| Device characterization of Dy-incorporated HfO2 gate oxide nMOS device: Device characteristics and reliability of DyO/HfO gate dielectrics and the application to NAND Flash memory | 978-3-8443-9342-2 (3-8443-9342-O) | 2011 |
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