| title | media type | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Electrical Overstress : Devices, Circuits and Systems | Hardcover | 978-1-118-51188-6 | 2013 | |
| Electrical Overstress - Eos: Devices, Circuits and Systems | Gedruckter Zugangscode | 978-1-118-70332-8 | 2013 | |
| ESD: Analog Circuits and Design | Hardcover | 978-1-119-96518-3 | 2014 | |
| ESD Basics: From Semiconductor Manufacturing to Product Use | " | 978-0-470-97971-6 | 2012 | |
| ESD: Circuits and Devices | " | 978-1-118-95446-1 | 2015 | |
| ESD: Circuits and Devices | " | 978-0-470-84754-1 | 2005 | |
| ESD: Design and Synthesis | " | 978-0-470-68571-6 | 2011 | |
| ESD: Failure Mechanisms and Models | " | 978-0-470-51137-4 | 2009 | |
| ESD: Physics and Devices | " | 978-0-470-84753-4 | 2004 | |
| ESD: RF Technology and Circuits | " | 978-0-470-84755-8 | 2006 | |
| ESD Testing: From Components to Systems | " | 978-0-470-51191-6 | 2016 | |
| ESD Testing: From Components to Systems | Digital | 978-1-118-70713-5 | 2016 | |
| Haematology: Clinical Cases Uncovered | Paperback | 978-1-4051-8322-2 | 2009 | Shaun McCann · Robin Foá · Owen Smith · Eibhlin Conneally |
| Integrated Circuit Design for Radiation Environments | Hardcover | 978-1-119-96634-0 | 2019 | Stephen J. Gaul · Nicolaas van Vonno · Wesley H. Morris |
| Latchup | " | 978-0-470-01642-8 | 2008 | |
| Latchup | Printed Access Code | 978-0-470-51617-1 | 2008 | |
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