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SirRaman Kannan
S.K.
·
S. Kannan
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(ISBN-10)
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tion
other author(s)
Design and Analysis of Accelerated Tests for Mission Critical Reliability
978-1-58488-471-2
(1-58488-471-1)
2004
Michael J. LuValle · Bruce G. LeFevre
Siruello Kabral