| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Electromigration and Stress Voiding | 978-0-471-04058-3 (0-471-04058-4) | 2009 | |
| Interlayer Dielectrics for Semiconductor Technologies | 978-0-12-511221-5 (0-12-511221-1) | 2004 | Moshe Eizenberg · Ashok K Sinha |