| Titel | Art | ISBN-13 (ISBN-10) | Erscheinungsjahr |
|---|---|---|---|
| Contactless VLSI Measurement and Testing Techniques | Taschenbuch | 978-3-319-88819-4 (3-319-88819-6) | 2018 |
| Contactless VLSI Measurement and Testing Techniques | Gebunden | 978-3-319-69672-0 (3-319-69672-6) | 2017 |
| Soft Error Mechanisms, Modeling and Mitigation | " | 978-3-319-30606-3 (3-319-30606-5) | 2016 |