| title | media type | ISBN-13 | year of publica- tion | other author(s) | |
|---|---|---|---|---|---|
| Network-on-Chip: The Next Generation of System-on-Chip Integration | Paperback | 978-1-138-74935-1 | 2017 | Santanu Kundu | |
| Network-on-Chip: The Next Generation of System-on-Chip Integration | Hardcover | 978-1-4665-6526-5 | 2014 | " | |
| Progress in VLSI Design and Test: 16th International Symposium on VSLI Design and Test, VDAT 2012, Shipur, India, July 1-4, 2012, Proceedings | Taschenbuch | 978-3-642-31493-3 | 2012 | Hafizur Rahaman · Sanatan Chattopadhyay | |
| Thermal-Aware Testing of Digital VLSI Circuits and Systems | Hardcover | 978-0-8153-7882-2 | 2018 | ||
| Thermal-Aware Testing of Digital VLSI Circuits and Systems | Digital | 978-1-351-22775-9 | 2018 | ||
| Thermal-Aware Testing of Digital VLSI Circuits and Systems | " | 978-1-351-22776-6 | 2018 | ||
| Thermal-Aware Testing of Digital VLSI Circuits and Systems | " | 978-1-351-22777-3 | 2018 | ||
| Thermal-Aware Testing of Digital VLSI Circuits and Systems | " | 978-1-351-22778-0 | 2018 | ||
CRC Press · Routledge · Springer