| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Intermittent Failures in Integrated Circuits: Detection, Characterization and Fault Tolerance | 978-1-4419-8314-5 (1-4419-8314-7) | 2016 | Alodeep Sanyal · Ilia Polian |
| Nanoscale CMOS VLSI Circuits: Design for Manufacturability | 978-0-07-163519-6 (0-07-163519-X) | 2010 | Aswin Sreedhar |
| Testing and Reliable Design of CMOS Circuits | 978-0-7923-9056-5 (0-7923-9056-3) | 1989 | Niraj K. Jha |