| title | ISBN-13 (ISBN-10) | year of publication |
|---|---|---|
| Testing Static Random Access Memories: Defects, Fault Models and Test Patterns | 978-1-4O2O-7752-4 (1-4O2O-7752-1) | 2004 |
S H · Sayed Hemeda · Scott Hunt · Shadi Hamid · Shady Hamadi · Syeda Hameed · Syuta Honda