| title | media type | | ISBN-13 | year of publica-
tion | other author(s) |
|---|
| Advances in Engineering Materials and Applied Mechanics: Proceedings of the International Conference on Machinery, Materials Science and Engineering Application, Wuhan, China, June 27-28 2015 | Hardcover | | 978-1-138-02834-0 | 2015 | Guangde Zhang · Quanjie Gao |
| Machinery, Materials Science and Engineering Applications: Proceedings of the 6th International Conference on Machinery, Materials Science and ... , Wuhan, China, October 26-29 2016 | " | | 978-1-138-02957-6 | 2017 | Fei Lei · Guangde Zhang |
| Machinery, Materials Science and Engineering Applications: Proceedings of the 6th International Conference on Machinery, Materials Science and ... , Wuhan, China, October 26-29 2016 | Digital | | 978-1-315-33042-6 | 2017 | Fei Lei · Guangde Zhang |
| Machinery, Materials Science and Engineering Applications: Proceedings of the 6th International Conference on Machinery, Materials Science and ... , Wuhan, China, October 26-29 2016 | " | | 978-1-315-34945-9 | 2017 | Fei Lei · Guangde Zhang |
| Materials Science, Machinery and Engineering Applications: Proceedings of the 6th International Conference on Machinery, Materials Science and ... , Wuhan, China, October 26-29 2016 | " | | 978-1-4987-8213-5 | 2016 | Fei Lei · Professor Zhang Guangde |
| Nanoporous Materials: Synthesis and Applications | Hardcover | | 978-1-4398-9205-3 | 2013 |
| Trace-Based Post-Silicon Validation for VLSI Circuits | Taschenbuch | | 978-3-319-37594-6 | 2016 | Xiao Liu |
| Trace-Based Post-Silicon Validation for VLSI Circuits | Gebunden | | 978-3-319-00532-4 | 2013 | " |
| Trace-Based Post-Silicon Validation for VLSI Circuits | Paperback | | 978-3-319-00534-8 | 2013 | " |