| title | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|
| Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories | 978-0-13-008465-1 | 2002 | Kanad Chakraborty |
| Genetic Algorithms for VLSI Design, Layout and Test Automation | 978-0-13-011566-9 | 1998 | Elizabeth Rudnick |
| Learning in Energy-Efficient Neuromorphic Computing: Algorithm and Architecture Co-Design | 978-1-119-50738-3 | 2019 | Nan Zheng |
| Neuromorphic Circuits for Nanoscale Devices | 978-87-7022-060-6 | 2019 | Yalcin Yilmaz · Idongesit Ebong · Woo Hyung Lee |
| Testing and Testable Design of High-Density Random-Access Memories | 978-0-7923-9782-3 | 1996 | Kanad Chakraborty |
Prentice Hall · River Publishers · Springer · Wiley