P W. · Patrick D. · Patrick W
Cambridge University Press · Wiley-VCH
| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) | |
|---|---|---|---|---|
| Magnetic and Electronic Films - Microstructure, Texture and Application to Data Storage: Volume 721 | 978-1-107-41190-6 (1-107-41190-4) | 2014 | ||
| X-ray Diffraction at Elevated Temperatures: A Method for in Situ Process Analysis | 978-3-527-27842-8 (3-527-27842-7) | 1993 | Deborah D. L. Chung · H. Arnold | |