| title | ISBN-13 | year of publication |
|---|---|---|
| National Instruments: Labview | 978-0-13-117608-9 | 2004 |
| Sm Labview Mac Edition Users Guide I/M | 978-0-13-236846-9 | 1995 |
| SM LABVIEW WIN EDITION USERS GUIDE I/M | 978-0-13-234022-9 | 1995 |
| Third IEEE International Workshop on Electronic Design, Test, and Applications: Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia | 978-0-7695-2500-6 | 2006 |
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