N. Keith Tovey

N K · N.K. Tovey

titlemedia typeISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary RocksPaperback978-0-521-01974-3
(0-521-01974-5)
2005David H. Krinsley · Kenneth Pye · Sam Boggs Jr
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary RocksHardcover978-0-521-45346-2
(0-521-45346-1)
1998David H. Krinsley · Kenneth Pye · Sam Boggs Jr

N. Kelen