| title | ISBN-13 | year of publication |
|---|---|---|
| Emitter Width Effect On Early Voltage In Bipolar Transistors: Modeling The Emitter Width Effect In BJT Transistors | 978-1-7259-7281-0 | 2018 |
| Measurement System Error Analysis: Analyzing and Reducing Measurement Errors In Test Systems | 978-1-4700-5405-2 | 2012 |
| Mismatch Theory And Measurement For Semiconductors | 978-1-4921-2495-5 | 2013 |
| Propagation Of Errors: How To Mathematically Predict Measurement Errors | 978-1-4699-8586-2 | 2012 |