M.-L. · M. Levinshtein · Michael E Levinshtein · Michael L.
Springer · World Scientific Pub Co Inc
| title | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|
| Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices | 978-1-4020-2169-5 | 2004 | Josef Sikula |
| Advanced experimental methods for noise research in nanoscale electronic devices: proceedings of the NATO advanced research workshop, Brno, Czech Republic, 2003 | 978-1-4020-2170-1 | 2004 | " |
| Breakdown Phenomena in Semiconductors and Semiconductor Devices | 978-981-256-395-8 | 2005 | |
| Sic Materials And Devices | 978-981-256-835-9 | 2006 | Michael Shur · Sergey Rumyantsev |
| SIC MATERIALS AND DEVICES - VOLUME 2 | 978-981-270-383-5 | 2007 | Michael Shur · Sergey Rumyantsev |