| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Design and Analysis of Accelerated Tests for Mission Critical Reliability | 978-1-58488-471-2 (1-58488-471-1) | 2004 | Bruce G. LeFevre · SirRaman Kannan |
J. L. · M J · M.-L. · Michael J. · Michael L.