| Titel | ISBN-13 (ISBN-10) | Erscheinungsjahr |
|---|---|---|
| The Silicon Carbide MOS Capacitor: A Study of Defects, Generation Lifetimes, Leakage Currents, and Other Interesting Nonidealities in the Non-equilibrium SiC/SiO2 MOS Capacitor | 978-3-639-O89O5-9 (3-639-O89O5-7) | 2008 |