| Titel | Art | ISBN-13 | Erschei- nungsjahr | andere Autoren |
|---|---|---|---|---|
| Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach | Taschenbuch | 978-3-642-05844-8 | 2010 | Alexei Gruverman |
| Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach | Gebunden | 978-3-540-20662-0 | 2004 | " |
| Wafer Bonding: Applications and Technology | Taschenbuch | 978-3-642-05915-5 | 2011 | Ulrich Gösele |
| Wafer Bonding: Applications and Technology | Gebunden | 978-3-540-21049-8 | 2004 | " |