| Titel | ISBN-13 (ISBN-10) | Erschei- nungsjahr | andere Autoren |
|---|---|---|---|
| Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs | 978-3-8383-64O4-9 (3-8383-64O4-X) | 2010 | Guido Groeseneken · Herman Maes |