| Titel | Art | ISBN-13 (ISBN-10) | Erschei- nungsjahr | andere Autoren |
|---|---|---|---|---|
| Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components | Taschenbuch | 978-3-642-07785-2 (3-642-07785-4) | 2010 | O. Breitenstein |
| Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components | Gebunden | 978-3-540-43439-9 (3-540-43439-9) | 2003 | " |