| title | media type | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Fundamentals of Nanoscale Film Analysis | Hardcover | 978-0-387-29260-1 | 2007 | Terry L Alford · James W. Mayer |
| Fundamentals of Surface Thin Film Analysis | Paperback | 978-0-13-500570-5 | 1986 | |
| Materials Analysis by Ion Channeling: Submicron Crystallography | " | 978-0-12-411991-8 | 2012 | |
| Materials Analysis by Ion Channeling: Submicron Crystallography | Hardcover | 978-0-12-252680-0 | 1982 | James W. Mayer · Steward T.A. Picraux |
C.F. · L. C. · L. C. Feldman · Leonard F. · Leonard Feldman
Academic Press · Prentice Hall · Springer