| title | media type | ISBN-13 | year of publica- tion | other author(s) | |
|---|---|---|---|---|---|
| Analysis and Design of Mosfets: Modeling, Simulation, and Parameter Extraction | Hardcover | 978-0-412-14601-5 | 1998 | Adelmo Ortiz-Conde · F. Garcia-Sanchez | |
| Electrostatic Discharge Protection: Advances and Applications | Paperback | 978-1-138-89307-8 | 2017 | ||
| Electrostatic Discharge Protection: Advances and Applications | Hardcover | 978-1-4822-5588-1 | 2015 | ||
| Modern Microwave Transistors: Theory, Design, and Performance | " | 978-0-471-41778-1 | 2002 | Frank Schwierz | |
| Nano Devices and Sensors | Taschenbuch | 978-1-5015-0154-8 | 2016 | Shien-Kuei Liaw · Yung-Hui Chung · Billion Abraham · Kuan-Chang Chang · Ting-Chang Chang · Yao-Feng Chang · Poki Chen | |
| Nano Devices and Sensors | Hardcover | 978-1-5015-1050-2 | 2016 | Shien-Kuei Liaw · Yung-Hui Chung | |
| Nanometer CMOS | " | 978-981-4241-08-3 | 2010 | Frank Schwierz · Hei Wong | |
| Nanometer CMOS | " | 978-981-270-709-3 | 2008 | Frank Schwierz · Hei Wong | |
| On-Chip Electro-Static Discharge Protection for Radio-Frequency Integrated Circuits | Gebunden | 978-3-319-10818-6 | 2015 | Qiang Cui · Jean-Jacques Hajjar · Javier Salcedo · Yuanzhong Zhou · Parthasarathy Srivatsan | |
| Principles and Analysis of Aigaas/GAAS Heterojunction Bipolar Transistors | Hardcover | 978-0-89006-587-7 | 1996 | ||
| Semiconductor Process Reliability in Practice | " | 978-0-07-175427-9 | 2012 | Zhenghao Gan · Waisum Wong | |
| Test Structure, Modeling and Characterization of Cmos-based RF Devices | " | 978-0-471-46965-0 | 2008 | ||
J J · J.J. Liou · J. L. · Juin Jei Liou · Juin Liou
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