| title | media type | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | Paperback | 978-1-4419-4285-2 | 2010 | Manoj Sachdev |
| Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | Hardcover | 978-0-387-46546-3 | 2007 | " |
| Integrated Circuit Defect-Sensitivity: Theory and Computational Models | " | 978-0-7923-9306-1 | 1992 | |
| Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration | Paperback | 978-94-024-0530-9 | 2016 | Amir Zjajo |
| Low-Power High-Resolution Analog to Digital Converters: Design, Test and Calibration | Hardcover | 978-90-481-9724-8 | 2010 | " |