| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| Materials Reliability Issues in Microelectronics: Volume 225 | 978-1-107-40987-3 (1-107-40987-X) | 2014 | |
| Reliability and Failure of Electronic Materials and Devices | 978-0-08-057552-0 (0-08-057552-8) | 2014 | Milton Ohring |
| Reliability and Failure of Electronic Materials and Devices, Second Edition | 978-0-12-088574-9 (0-12-088574-3) | 2009 | " |
J. L. · J. Lloyd · J R · J. R. Lloyd · James L. · James Lloyd · James R. · R. L · R. Lloyd
Academic Press · Cambridge University Press · Pergamon Press