| Titel | ISBN-13 (ISBN-10) | Erschei- nungsjahr | andere Autoren |
|---|---|---|---|
| An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs | 978-3-8443-3263-6 (3-8443-3263-4) | 2011 | Nor Hisham Bin Hamid · Vijanth Sagayan Asirvadam |