| Titel | ISBN-13 (ISBN-10) | Erschei- nungsjahr | andere Autoren |
|---|---|---|---|
| VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers | 978-3-319-46098-7 (3-319-46098-6) | 2016 | Youngsoo Shin · Chi Ying Tsui · Kiyoung Choi · Ricardo Reis |
| VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC ... and Communication Technology, Band 483) | 978-3-319-83440-5 (3-319-83440-1) | 2018 | Youngsoo Shin · Chi Ying Tsui · Kiyoung Choi · Ricardo Reis |
| VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC ... and Communication Technology , Band 483) | 978-3-319-46096-3 (3-319-46096-X) | 2016 | Youngsoo Shin · Chi Ying Tsui · Kiyoung Choi · Ricardo Reis |