| title | ISBN-13 (ISBN-10) | year of publication |
|---|---|---|
| Icmts 1996: 1996 IEEE International Conference on Microelectronic Test Structures: Mar 25-28, 1996: Trento, Italy: Proceedings | 978-O-78O3-2783-2 (O-78O3-2783-7) | 1996 |
Italy) Ifip Tc5 Wg5.2 Workshop on Knowledge Intensive CAD 2000 (Parma